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1

An investigation of hot carrier effects in submicron CMOS integrated circuits

Peng Fang, Rajat Rakkhit, John T. Yue

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 706 KB

english, 1993

2

[IEEE IEEE International Integrated Reliability Workshop, 1996. - Lake Tahoe, CA, USA (Oct. 20-23, 1996)] 1996 International Integrated Reliability Workshop Final Report - Impact of boron penetration at the p/sup +/-poly/gate-oxide interface on the device reliability of deep submicron CMOS logic technology

Nayak, D.K., Ming-Yin Hao,, Rakkhit, R.

Year:

1996

Language:

english

File:

PDF, 178 KB

english, 1996

3

Characterization and optimization of metal etch processes to minimize charging damage to submicron transistor gate oxide

Lin, M.-R., Fang, P., Heiler, F., Lee, R., Rakkhit, R., Shen, L.

Journal:

IEEE Electron Device Letters

Year:

1994

Language:

english

File:

PDF, 294 KB

english, 1994

4

Association between IL13 Polymorphisms and Psoriatic Arthritis Is Modified by Smoking

Duffin, Kristina Callis, Freeny, Ingrid C, Schrodi, Steven J, Wong, Bob, Feng, Bing-Jian, Soltani-Arabshahi, Razieh, Rakkhit, Tina, Goldgar, David E, Krueger, Gerald G

Journal:

The Journal of Investigative Dermatology

Year:

2009

Language:

english

File:

PDF, 213 KB

english, 2009

5

The Role of Radiation Therapy in the Management of Skin Cancers

Hulyalkar, Rohun, Rakkhit, Tina, Garcia-Zuazaga, Jorge

Journal:

Dermatologic Clinics

Year:

2011

Language:

english

File:

PDF, 190 KB

english, 2011

6

[IEEE 27th Annual Proceedings., International Reliability Physics Symposium - Phoenix, AZ, USA (11-13 April 1989)] 27th Annual Proceedings., International Reliability Physics Symposium - An investigation of the time dependence of current degradation in MOS devices

Rakkhit, R., Peckerar, M.C., Yao, C.T.

Year:

1989

Language:

english

File:

PDF, 438 KB

english, 1989

7

High Risk of Recurrence for Patients With Breast Cancer Who Have Human Epidermal Growth Factor Receptor 2-Positive, Node-Negative Tumors 1 cm or Smaller

Gonzalez-Angulo, A. M., Litton, J. K., Broglio, K. R., Meric-Bernstam, F., Rakkhit, R., Cardoso, F., Peintinger, F., Hanrahan, E. O., Sahin, A., Guray, M., Larsimont, D., Feoli, F., Stranzl, H., Buchh

Journal:

Journal of Clinical Oncology

Year:

2009

Language:

english

File:

PDF, 136 KB

english, 2009

8

ChemInform Abstract: The Preparation of 4,5-Dihydro-3-aryl-naphth-[1,2-c]-isoxazoles from Dilithiated 1-Tetralone Oxime and Aromatic Esters.

Charles F. Beam, Deborah A. Schady, Kelly L. Rose, Wayne Kelley Jr., Ronjay Rakkhit, Christopher D. Hornsby, Shannon L. Studer-Martinez

Journal:

Year:

2000

File:

PDF, 27 KB

2000

9

[IEEE IEEE 1995 International Integrated Reliability Workshop. Final Report - Lake Tahoe, CA, USA (22-25 Oct. 1995)] IEEE 1995 International Integrated Reliability Workshop. Final Report - A new technique to measure thin oxide thickness in IC manufacturing

Nayak, D.K., Wang, L., Rakkhit, R.

Year:

1995

Language:

english

File:

PDF, 97 KB

english, 1995

10

BCR-JAK2 fusion as a result of a translocation (9;22)(p24;q11.2) in a patient with CML-like myeloproliferative disease

Mohamed M Elnaggar, Sally Agersborg, Trilochan Sahoo, Ati Girgin, Wanlong Ma, Ronjay Rakkhit, Isabel Zorrilla, Alexis Leal

Journal:

Molecular Cytogenetics

Year:

2012

Language:

english

File:

PDF, 1.35 MB

english, 2012

11

Morpheaform Basal Cell Carcinoma in African Americans

NADIMINTI, UMA, RAKKHIT, TINA, WASHINGTON, CARL

Journal:

Dermatologic Surgery

Year:

2004

Language:

english

File:

PDF, 763 KB

english, 2004

12

The Preparation of 4,5-Dihydro-3-Aryl-Naphth-[1,2- c ]- Isoxazoles From Dilithiated 1-Tetralone Oxime and Aromatic Esters

Beam, Charles F., Schady, Deborah A., Rose, Kelly L., Kelley, Wayne, Rakkhit, Ronjay, Hornsby, Christopher D., Studer-Martinez, Shannon L.

Journal:

Synthetic Communications

Year:

2000

Language:

english

File:

PDF, 510 KB

english, 2000

13

A comprehensive study of performance and reliability of P, As, and hybrid As/P nLDD junctions for deep-submicron CMOS logic technology

D. Nayak, Ming-yin Hao, J. Umali, R. Rakkhit

Journal:

IEEE Electron Device Letters

Language:

english

File:

PDF, 71 KB

english

14

Morpheaform Basal Cell Carcinoma in African Americans

Uma Nadiminti, Tina Rakkhit, Carl Washington

Journal:

Dermatologic Surgery

Year:

2004

Language:

english

File:

PDF, 763 KB

english, 2004

15

[IEEE Proceedings of IEEE International Reliability Physics Symposium - Atlanta, GA, USA (1993.03.23-1993.03.25)] 31st Annual Proceedings Reliability Physics 1993 - Process induced oxide damage and its implications to device reliability of submicron transistors

Rakkhit, R., Heiler, F.P., Fang, P., Sander, C.

Year:

1993

Language:

english

File:

PDF, 299 KB

english, 1993

16

[IEEE 29th Annual Reliability Physics 1991 - Las Vegas, NV, USA (9-11 April 1991)] 29th Annual Proceedings Reliability Physics 1991 - A comparison of inverter-type circuit lifetime and quasi-static analysis of NMOSFET lifetime

Rakkhit, R., Yue, J.T.

Year:

1991

File:

PDF, 375 KB

1991

17

[IEEE 28th Annual on Reliability Physics Symposium - New Orleans, LA, USA (27-29 March 1990)] 28th Annual Proceedings on Reliability Physics Symposium - Drain-avalanche induced hole injection and generation of interface traps in thin oxide MOS devices

Rakkhit, R., Haddad, S., Chang, C., Yue, J.

Year:

1990

File:

PDF, 314 KB

1990

18

Slight gate oxide thickness increase in PMOS devices with BF2 implanted polysilicon gate

Jiunn-Yann Tsai,, Ying Shi,, Prasad, S., Yeh, S.W.-C., Rakkhit, R.

Journal:

IEEE Electron Device Letters

Year:

1998

Language:

english

File:

PDF, 63 KB

english, 1998

19

Plaque thickness and morphology in psoriasis vulgaris associated with therapeutic response

T. Rakkhit, J.M. Panko, T.E. Christensen, B. Wong, T. Nelson, J. Papenfuss, C.B. Hansen, K. Callis-Duffin, G.G. Krueger

Journal:

British Journal of Dermatology

Year:

2009

Language:

english

File:

PDF, 246 KB

english, 2009

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